Serial crystallography using X-ray free-electron lasers enables the collection of\ntens of thousands of measurements from an equal number of individual crystals,\neach of which can be smaller than 1 mmin size. This manuscript describes\nan alternativeway of handling diffraction data recorded by serial femtosecond\ncrystallography, by mapping the diffracted intensities into three-dimensional\nreciprocal space rather than integrating each image in two dimensions as in the\nclassical approach. We call this procedure ââ?¬Ë?three-dimensional mergingââ?¬â?¢. This\nprocedure retains information about asymmetry in Bragg peaks and diffracted\nintensities between Bragg spots. This intensity distribution can be used to\nextract reflection intensities for structure determination and opens up novel\navenues for post-refinement, while observed intensity between Bragg peaks\nand peak asymmetry are of potential use in novel direct phasing strategies.
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